-
Crystal growth from solution
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/P8110011-e1414112632190.jpgRecrystalization in aqueous solution of triglycine sulfate.
-
Geissler tube
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/P4030304-e1414112782529.jpgGeissler tube is used as a vacuum gauge by fluorescence.
-
4-circle X-ray diffractometer
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/P3010023-e1414113504560.jpgX-ray diffraction is carried out by orienting sample using three axes. The remaining axis is for orientation of the detector.
-
Hysteresis loop
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/P9080264-e1414116422842.jpgHorizontal axis of oscilloscope shows intensity of electric field and the vertical axis is the amount of charge accumulated in the sample by the electric field. The charge is not proportional to the electric field.
-
Sample for X-ray diffraction
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/LHS-Xray-sample2-e1414116906368.jpgSingle crystal sample for X-ray diffraction. The shape and size are spherical and 0.3mm. Glass rod for the support is attached to the bottom of the sample.
-
Titanium oxide thin film prepared by sputtering
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/SnO2-A-e1414118600650.pngSurface of the titanium oxide thin film (left) and the cross-section (right). Large porosity has advantage for a large surface area.
-
Titanate nanorods
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/TiO2-A-e1414120058513.pngTitanium oxide tabular nanorods with several hundred nanometers in thickness have grown.
-
Tungsten trioxide nanoparticles
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/WO3-A-e1414122617828.pngParticle size changes (600℃ left, 800℃ right) with the heat treatment temperature.
-
Preparation of thin film by sputtering
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/10/DSCN0285-e1414715562683.jpgThin film are produced by a sputtering phenomenon utilizing a discharge plasma of noble-gas.
-
Automatic gas sorption analyzer
http://piezo.eng.u-toyama.ac.jp/wp-content/uploads/2014/12/DSCN0290.jpgMeasurement of surface area and pore size distribution of materials with micropores.
Many technological advancements have resulted from the discovery and development of materials with new properties or functions.
The Basic Material Group has been developing single crystal growth and nanoparticle fabrication techniques of new semiconductors and dielectric materials. Their physical properties and application with them have also been investigated.